Microstructural, electrical and reliability aspects of chromium doped Ni-Mn-Fe-O NTC thermistor materials

Materials Science and Engineering: B

Volumn 149, Issue 1, 2008, Pages 47-52

  Varghese, Justin M ^a   Seema, A ^a   Dayas, K R ^a  

^a CENTRE FOR MATERIALS FOR ELECTRONICS TECHNOLOGY C MET   (India)

Author keywords

Chromium; Electrical measurements; Electron microscopy; Nickel; NTC thermistor; Reliability

Indexed keywords

CHROMIUM COMPOUNDS; DOPING (ADDITIVES); ELECTRIC PROPERTIES; ELECTRON MICROSCOPY; MICROSTRUCTURE; NICKEL COMPOUNDS;

ELECTRICAL MEASUREMENTS; NEGATIVE TEMPERATURE COEFFICIENT (NTC); NTC THERMISTORS; THERMISTOR MATERIALS;

THERMISTORS;

EID: 40149089399     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.12.005     Document Type: Article

References (24)