Beamlet deflection due to beamlet-beamlet interaction in a large-area multiaperture negative ion source for JT-60U

Review of Scientific Instruments

Volumn 79, Issue 2, 2008, Pages

  Kamada, M ^a   Hanada, M ^a   Ikeda, Y ^a   Grisham, L R ^b   Jiang, W ^c  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b PRINCETON PLASMA PHYSICS LABORATORY   (United States)

^c NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SPACE CHARGE; ION BEAMS; NEGATIVE IONS;

BEAMLET DEFLECTION; BEAMLET TRAJECTORY; MULTIAPERTURE GRIDS; SPACE CHARGE REPULSION;

ION SOURCES;

EID: 40149089079     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2819333     Document Type: Article

References (4)

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