Extended depth of focus in tomographic phase microscopy using a propagation algorithm

Optics Letters

Volumn 33, Issue 2, 2008, Pages 171-173

  Choi, Wonshik ^a   Fang Yen, Christopher ^a   Badizadegan, Kamran ^a,b   Dasari, Ramachandra R ^a   Feld, Michael S ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b MASSACHUSETTS GENERAL HOSPITAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AXIAL DISTANCES; TOMOGRAPHIC PHASE MICROSCOPY;

ALGORITHMS; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; TOMOGRAPHY;

LASER INTERFEROMETRY;

ARTICLE; HUMAN; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY; OPTICAL TOMOGRAPHY; TUMOR CELL LINE;

CELL LINE, TUMOR; HUMANS; IMAGE PROCESSING, COMPUTER-ASSISTED; TOMOGRAPHY, OPTICAL;

EID: 40149086347     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.33.000171     Document Type: Article

References (8)