Subtraction of test mass angular noise in the LISA technology package interferometer

Applied Physics B: Lasers and Optics

Volumn 90, Issue 3-4, 2008, Pages 395-400

  Guzman Cervantes F ^a   Steier, F ^a   Wanner, G ^a   Heinzel, G ^a   Danzmann, K ^a  

^a ALBERT EINSTEIN INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; JITTER; MIRRORS; PIEZOELECTRIC TRANSDUCERS; SENSITIVITY ANALYSIS; SIGNAL NOISE MEASUREMENT;

ANGULAR ALIGNMENT JITTERS; LISA TECHNOLOGY PACKAGE INTERFEROMETERS; PICOMETER ACCURACY; TEST MASS ANGULAR NOISE;

NOISE ABATEMENT;

EID: 40149083389     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-007-2923-0     Document Type: Article

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