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Volumn 264, Issue 11-12, 2008, Pages 914-919
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Micro and macroscale tribological behavior of epitaxial Ti3SiC2 thin films
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Author keywords
Atomic force microscopy; Ball on disk; Friction; MAX phase; Scanning electron microscopy; Ti3SiC2
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Indexed keywords
ABRASIVES;
ATOMIC FORCE MICROSCOPY;
MAGNETRON SPUTTERING;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
TITANIUM COMPOUNDS;
TRIBOLOGY;
WEAR OF MATERIALS;
BALL-ON-DISK;
KINK FORMATION;
MAX PHASE;
THIN FILMS;
ABRASIVES;
ATOMIC FORCE MICROSCOPY;
MAGNETRON SPUTTERING;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
TITANIUM COMPOUNDS;
TRIBOLOGY;
WEAR OF MATERIALS;
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EID: 40049109663
PISSN: 00431648
EISSN: None
Source Type: Journal
DOI: 10.1016/j.wear.2007.06.013 Document Type: Article |
Times cited : (37)
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References (18)
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