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Volumn 20, Issue 1, 2008, Pages 59-76

Towards a deeper understanding of test coverage

Author keywords

Level of testing; Test coverage; Test granularity; Test optimization

Indexed keywords

OPTIMIZATION; PROJECT MANAGEMENT;

EID: 40049103889     PISSN: 1532060X     EISSN: 15320618     Source Type: Journal    
DOI: 10.1002/smr.362     Document Type: Article
Times cited : (15)

References (23)
  • 9
    • 85008023578 scopus 로고    scopus 로고
    • A survey of unit testing practices
    • Runeson P. A survey of unit testing practices. IEEE Software 2006; 23(4):22-29.
    • (2006) IEEE Software , vol.23 , Issue.4 , pp. 22-29
    • Runeson, P.1
  • 14
    • 40049104617 scopus 로고    scopus 로고
    • PMD:, 6 May 2007
    • PMD: Source code analyser. http://pmd.sourceforge.net [6 May 2007].
    • Source code analyser


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.