Subnanometer imaging of adsorbate-induced electronic structure perturbation on silicon surfaces

Journal of Physical Chemistry C

Volumn 112, Issue 6, 2008, Pages 2116-2120

  Guisinger, N P ^a   Yoder, N L ^a   Elder, S P ^a   Hersam, M C ^a,b  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ORGANIC MOLECULES; TOPOGRAPHIC IMAGING;

BINDING ENERGY; CHARGE TRANSFER; ELECTRONIC STRUCTURE; SCANNING TUNNELING MICROSCOPY; TOPOGRAPHY;

SILICON;

EID: 40049099673     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp709765x     Document Type: Article

References (38)