Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

Journal of Microscopy

Volumn 229, Issue 2, 2008, Pages 275-280

  Grmela, L ^a   Macku, R ^a   Tomanek, P ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Electroluminescence; Luminescence centres; Nanocrystal; Phosphor; Photoluminescence; Scanning near field optical microscopy; ZnS:Mn

Indexed keywords

II-VI SEMICONDUCTORS; NANOCRYSTALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; PHOSPHORS; PHOTOLUMINESCENCE; THIN FILM DEVICES; THIN FILMS; ZINC SULFIDE;

AGING CHARACTERISTICS; ELECTRO-OPTICAL; LUMINESCENCE CENTERS; MEASUREMENTS OF; NEAR FIELD STUDY; NEAR-FIELD MEASUREMENT; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; THIN-FILM ELECTRO-LUMINESCENT DEVICES; ZNS:MN; ZNS:MN NANOCRYSTALS;

ELECTROLUMINESCENCE;

MANGANESE; NANOCRYSTAL; NANOFILM; PHOSPHORUS; ZINC SULFIDE;

CONFERENCE PAPER; FILM; LUMINESCENCE; PHOTOLUMINESCENCE; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 40049087821     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.01900.x     Document Type: Conference Paper

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