Resonance frequency analysis for surface-coupled atomic force microscopy cantilever in ambient and liquid environments

Applied Physics Letters

Volumn 92, Issue 8, 2008, Pages

  Mirman, Boris ^a   Kalinin, Sergei V ^b  

^a SUFFOLK UNIVERSITY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NATURAL FREQUENCIES;

FORCE MODULATION MICROSCOPY; LIQUID ENVIRONMENTS; RESONANCE FREQUENCY ANALYSIS;

CANTILEVER BEAMS;

EID: 40049087139     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2801524     Document Type: Article

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