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Volumn 112, Issue 6, 2008, Pages 1759-1763
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Determination of nanocluster sizes from dark-field scanning transmission electron microscopy images
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Author keywords
[No Author keywords available]
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Indexed keywords
HIGH-ANGLE ANNULAR DARK-FIELD IMAGING;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
CRYSTALLOGRAPHY;
IMAGE ANALYSIS;
IMAGING TECHNIQUES;
SCANNING ELECTRON MICROSCOPY;
SIZE DISTRIBUTION;
TRANSMISSION ELECTRON MICROSCOPY;
NANOCLUSTERS;
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EID: 40049086501
PISSN: 19327447
EISSN: 19327455
Source Type: Journal
DOI: 10.1021/jp710959x Document Type: Article |
Times cited : (21)
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References (19)
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