The angle-resolved photoemission study for ultrathin NiO and CoO thin films on Ag(1 0 0) surfaces

Physica B: Condensed Matter

Volumn 403, Issue 5-9, 2008, Pages 1539-1541

  Cheng, C M ^a   Wang, C C ^b   Jeng, H T ^c,d   Hsue, C S ^c   Hsu, B Y ^a   Huang, D J ^a,c   Tsuei, K D ^a,c  

^a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^d INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

Angle resolved photoemission spectroscopy; Electronic structure; NiO; Transition metal oxide

Indexed keywords

COBALT COMPOUNDS; ELECTRONIC STRUCTURE; FILM THICKNESS; MONOLAYERS; NICKEL OXIDE; PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED PHOTOEMISSION SPECTROSCOPY (ARPES); ANGLER-INTEGRATED PHOTOEMISSION SPECTRA (AIPES); BAND DISPERSIONS; TRANSITION METAL OXIDES;

THIN FILMS;

EID: 40049084840     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2007.10.184     Document Type: Article

References (7)

1. Altieri S., et al. Phys. Rev. Lett. 91 (2003) 137201
2. Haverkort M.W., et al. Phys. Rev. B 69 (2004) 020408
3. Giovanardi C., et al. Phys. Rev. B 69 (2004) 075418
4. Hite D.A., et al. J. Vaccum Sci. Tech. A 18 (2000) 1950
5. Hagendorf Ch., et al. Surface Sci. 532-535 (2003) 346
6. Shen Z.-X., et al. Phys. Rev. B 44 (1991) 3604
7. Shen Z.-X., et al. Phys. Rev. B 42 (1990) 1817