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Volumn 33, Issue 2, 2008, Pages 115-121
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In situ high-resolution transmission electron microscopy in the study of nanomaterials and properties
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON NANOTUBES;
NANOSTRUCTURED MATERIALS;
NANOWIRES;
OPTICAL RESOLVING POWER;
PHASE TRANSITIONS;
ATOMIC LEVEL;
INTERPHASE BOUNDARIES;
NANOMETERSIZED PARTICLES;
PHASE FORMATION;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 39849083013
PISSN: 08837694
EISSN: None
Source Type: Journal
DOI: 10.1557/mrs2008.24 Document Type: Article |
Times cited : (24)
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References (33)
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