Performance test of BESIII TOF electronics by PMT signal

He Jishu/Nuclear Techniques

Volumn 31, Issue 1, 2008, Pages 5-9

  Wu, Jinjie ^a,b   Heng, Yuekun ^a   Liu, Shubin ^c   Guo, Jianhua ^c   Feng, Changqing ^c   An, Qi ^c   Sun, Zhijia ^a   Zhao, Yuda ^a  

^a INSTITUTE OF HIGH ENERGY PHYSICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

BESIII; Charge resolution; Electronics; Time of flight; Time resolution

Indexed keywords

EID: 39749202209     PISSN: 02533219     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)