Thyristor-based volatile memory in nano-scale CMOS

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2006, Pages

  Roy, Rich ^a   Nemati, Farid ^a   Young, Ken ^a   Bateman, Bruce ^a   Chopra, Rajesh ^a   Jung, Seong Ook ^a   Show, Chiming ^a   Cho, Hyun Jin ^a  

^a T RAM Semiconductor   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINFET TECHNOLOGIES; THYRISTOR-BASED MEMORY CELL TECHNOLOGY;

FIELD EFFECT TRANSISTORS; SILICON ON INSULATOR TECHNOLOGY; STATIC RANDOM ACCESS STORAGE; THYRISTORS;

CMOS INTEGRATED CIRCUITS;

EID: 39749187678     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)