The power of exhaustive bridge diagnosis using IDDQ speed, confidence, and resolution

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Heaberlin, Doug ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; LOGIC CIRCUITS; PROGRAM PROCESSORS; ROBUSTNESS (CONTROL SYSTEMS);

DIAGNOSTIC RESOLUTION; EXHAUSTIVE BRIDGE DIAGNOSIS; INDUSTRIAL CIRCUIT DESIGNS;

FAILURE ANALYSIS;

EID: 39749185976     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297692     Document Type: Conference Paper

References (20)