Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Gurumurthy, Sankar ^a   Vasudevan, Shobha ^a   Abraham, Jacob A ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC PROGRAMMING; BOOLEAN FUNCTIONS; MICROPROCESSOR CHIPS; PROGRAM PROCESSORS; REQUIREMENTS ENGINEERING;

AUTOMATIC GENERATION; BOOLEAN DIFFERENCE PROBLEM; MODULE TESTS; TEST GENERATION;

FAULT TOLERANCE;

EID: 39749169032     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297676     Document Type: Conference Paper

References (19)