On-line boundary-scan testing in service of extended products

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Reis, Ilkka ^a   Collins, Peter ^c   Van Houcke, Marc ^b  

^a Patria Systems

^b JTAG Technologies

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEMS; DESIGN FOR TESTABILITY; ELECTRONIC EQUIPMENT; FAULT DETECTION; ONLINE SYSTEMS;

EMBEDDED ELECTRONICS; MULTIBOARD SYSTEMS;

PRODUCT DESIGN;

EID: 39749165142     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297745     Document Type: Conference Paper

References (16)