Statistical analysis and optimization of parametric delay test

Proceedings - International Test Conference

Volumn , Issue , 2008, Pages

  Wu, Sean H ^a   Lee, Benjamin N ^a   Wang, Li C ^a   Abadir, Magdy S ^b  

^a University of California

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CHARACTERIZATION; INITIAL SAMPLE CHIPS; RANDOM FORESTS; STATISTICAL LEARNING;

DEFECTS; LEARNING SYSTEMS; MICROPROCESSOR CHIPS; OPTIMIZATION; PARAMETER ESTIMATION; SEMICONDUCTING SILICON; STATISTICAL METHODS;

TREES (MATHEMATICS);

EID: 39749153567     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2007.4437626     Document Type: Conference Paper

References (19)