Self-repairing SRAM for reducing parametric failures in nanoscaled memory

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2006, Pages 132-133

  Mukhopadhyay, Saibal ^a   Kim, Keejong ^a   Mahmoodi, Hamid ^b   Datta, Animesh ^a   Park, Dongkyu ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

^b SAN FRANCISCO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERDIE VT VARIATION; PARAMETRIC FAILURES;

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; PARAMETER ESTIMATION; STORAGE ALLOCATION (COMPUTER);

STATIC RANDOM ACCESS STORAGE;

EID: 39749143369     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)