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Volumn 72, Issue 1, 2008, Pages 118-134
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Stage-gate controls, learning failure, and adverse effect on novel new products
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Author keywords
Learning failure; Process improvement; Product development teams; Project inflexibility; Stage gate controls
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Indexed keywords
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EID: 39749142764
PISSN: 00222429
EISSN: None
Source Type: Journal
DOI: 10.1509/jmkg.72.1.118 Document Type: Article |
Times cited : (230)
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References (69)
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