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Volumn 72, Issue 1, 2008, Pages 118-134

Stage-gate controls, learning failure, and adverse effect on novel new products

Author keywords

Learning failure; Process improvement; Product development teams; Project inflexibility; Stage gate controls

Indexed keywords


EID: 39749142764     PISSN: 00222429     EISSN: None     Source Type: Journal    
DOI: 10.1509/jmkg.72.1.118     Document Type: Article
Times cited : (230)

References (69)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.