Signature based diagnosis for logic BIST

Proceedings - International Test Conference

Volumn , Issue , 2007, Pages

  Cheng, Wu Tung ^a   Sharma, Manish ^a   Rinderknecht, Thomas ^a   Lai, Liyang ^a   Hill, Chris ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; INTEGRATED CIRCUITS; PRODUCT DESIGN;

DIAGNOSIS RESOLUTION; FAILING DEVICE;

BUILT-IN SELF TEST;

EID: 39749141625     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2007.4437703     Document Type: Conference Paper

References (19)