Algorithms for pattern rejection

Proceedings - International Conference on Pattern Recognition

Volumn 2, Issue , 1996, Pages 869-874

  Baker, Simon ^a   Nayar, Shree K ^a  

^a Department of Computer Science Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISCRIMINANT ANALYSIS; OBJECT RECOGNITION;

COMPUTATIONAL EFFORT; EFFICIENCY IMPROVEMENT; FEATURE DETECTION; FISHER'S DISCRIMINANT; KARHUNEN LOEVE EXPANSION; NUMBER OF CLASS; PATTERN REJECTION; RECOGNITION ALGORITHM;

ALGORITHMS;

EID: 39749105102     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.1996.547200     Document Type: Conference Paper

References (8)

1. S. Baker and S.K. Nayar, "Pattern Rejection," In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, San Francisco, 1996.
2. S. Baker and S.K. Nayar, "A Theory of Pattern Rejection," Columbia University Technical Report, CUCS-013-95,1995.
3. R.O. Duda and P.E. Hart, Pattern Classification and Scene Analysis, John Wiley & Sons, 1973.
4. R.A. Fisher, "The use of multiple measurements in taxonomic problems," Annals of Eugenics, 7:179-188,1939.
5. K. Fukunaga, Statistical Pattern Recognition, Academic Press, 1990.
6. [Murakami and Kumar 82] H. Murakami and V. Kumar, "Efficient calculation of primary images from a set of images," IEEE Transactions on Pattern Analysis and Machine Intelligence, 4:511-515,1982.
7. H. Murase and S.K. Nayar, "Visual Learning and Recognition of 3D Objects from Appearance," Internationaljournal of Computer Vision, 14:5-24,1995.
8. S.K. Nayar, S. Baker, and H. Murase, "Parametric Feature Detection," In Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, San Francisco, 1996.