|
Volumn , Issue , 2006, Pages
|
Fully automated semiconductor operating condition testing
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DATA STORAGE EQUIPMENT;
FAILURE ANALYSIS;
GENETIC ALGORITHMS;
RECURSIVE FUNCTIONS;
STATISTICAL METHODS;
AUTOMATED OPERATING CONDITION TESTING (AOCT);
SCRIPTING LANGUAGE;
SEMICONDUCTOR DEVICES;
|
EID: 39749093750
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/TEST.2006.297717 Document Type: Conference Paper |
Times cited : (5)
|
References (20)
|