Fundamentals of timing information for test: How simple can we get?

Proceedings - International Test Conference

Volumn , Issue , 2007, Pages

  Kapur, Rohit ^a   Zejda, Jindrich ^a   Williams, T W ^a  

^a SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; COMPUTER AIDED SOFTWARE ENGINEERING; STATIC ANALYSIS; TIMING CIRCUITS;

AUTOMATION TOOLS; CLOCK TREES; SIGNAL INTEGRITY;

INTEGRATED CIRCUIT TESTING;

EID: 39749084685     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2007.4437609     Document Type: Conference Paper

References (18)