SCOPUS 정보 검색 플랫폼

Volumn 62, Issue 2, 2008, Pages 232-237

Spectral force analysis using atomic force microscopy reveals the importance of surface heterogeneity in bacterial and colloid adhesion to engineered surfaces

(3) Ma, Huilian a Winslow, Charles J a Logan, Bruce E a

a The Pennsylvania State University (United States)

Author keywords

AFM force volume imaging; Bacterial adhesion; Surface heterogeneity

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COLLOIDS; SURFACE PHENOMENA;

ENGINEERED SURFACES; FORCE VOLUME IMAGING; SPECTRAL FORCE ANALYSIS (SFA); SURFACE HETEROGENEITY;

BACTERIA;

SILICON; TITANIUM DIOXIDE;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; BACTERIUM ADHERENCE; BIOFOULING; COLLOID; HYDROPHILICITY; IMAGING; MATERIAL COATING; NONHUMAN; PRIORITY JOURNAL; SPECTROSCOPY; SURFACE PROPERTY;

BACTERIAL ADHESION; COLLOIDS; DATA INTERPRETATION, STATISTICAL; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; PROTEIN ENGINEERING; SILICON DIOXIDE; SURFACE PROPERTIES; TITANIUM;

BACTERIA (MICROORGANISMS);

EID: 39449125642 PISSN: 09277765 EISSN: None Source Type: Journal
DOI: 10.1016/j.colsurfb.2007.10.007 Document Type: Article

Times cited : (26)

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