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Volumn 31, Issue 1, 2008, Pages 32-40

Tin whisker electrical short circuit characteristics - Part I

Author keywords

Contact resistance; Focused ion beam (FIB); Short circuit; Tin whiskers

Indexed keywords

CONTACT RESISTANCE; CRYSTAL WHISKERS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTORS; FOCUSED ION BEAMS; PROBABILITY;

EID: 39449104186     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2007.914210     Document Type: Article
Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.