A family of tests for trend change in mean residual life

Communications in Statistics - Theory and Methods

Volumn 27, Issue 5, 1998, Pages 1163-1179

  Lim, Jae Hak ^a   Park, Dong Ho ^b  

^a Daejon National University of Technology   (South Korea)

^b Hallym University   (South Korea)

Author keywords

Censoring; DIMRL; Empirical power; Empirical test size; IDMRL; Kaplan Meier estimator; L statistic

Indexed keywords

EID: 3943083092     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1080/03610929808832151     Document Type: Article

References (13)

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