Fast profile measurement of micrometer-sized tapered fibers with better than 50-nm accuracy

Optics Letters

Volumn 29, Issue 15, 2004, Pages 1727-1729

  Warken, Florian ^a   Giessen, Harald ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT INTENSITY; NONLINEAR PROCESSING; PHASE JUMPS; TAPERED FIBERS;

ALGORITHMS; DIELECTRIC MATERIALS; DIFFRACTION; LASER BEAMS; LIGHT; LIGHT TRANSMISSION; PARAMETRIC OSCILLATORS; POLARIZATION; REFLECTION; SCANNING ELECTRON MICROSCOPY; SCATTERING;

GLASS FIBERS;

EID: 3943074458     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.29.001727     Document Type: Article

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