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Volumn 17, Issue 3, 1999, Pages 895-898

Quantitative analysis of sputtered α- and α+β-brass surfaces by using Auger electron spectroscopy with principal component analysis-target factor analysis

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Indexed keywords


EID: 3943069759     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582033     Document Type: Article
Times cited : (5)

References (18)
  • 8
    • 0018443516 scopus 로고
    • S. W. Gaarenstroom, J. Vac. Sci. Technol. 16, 600 (1979); ibid. 20, 2458 (1980); Appl. Surf. Sci. 7, 7 (1981).
    • (1980) J. Vac. Sci. Technol. , vol.20 , pp. 2458
  • 9
    • 0018443516 scopus 로고
    • S. W. Gaarenstroom, J. Vac. Sci. Technol. 16, 600 (1979); ibid. 20, 2458 (1980); Appl. Surf. Sci. 7, 7 (1981).
    • (1981) Appl. Surf. Sci. , vol.7 , pp. 7
  • 14
    • 3943068793 scopus 로고    scopus 로고
    • PHI-MATLAB, Perkin-Elmer, Physical Electronics Division, Eden Prairie, Minnesota, 1992
    • PHI-MATLAB, Perkin-Elmer, Physical Electronics Division, Eden Prairie, Minnesota, 1992.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.