Threshold behavior of nanometer scale fabrication process using scanning tunneling microscopy

Journal of Applied Physics

Volumn 81, Issue 3, 1997, Pages 1227-1230

  Wang, Chen ^a   Li, Xiaodong ^a,b   Shang, Guangyi ^a   Qiu, Xiaohui ^a   Bai, Chunli ^a  

^a INSTITUTE OF CHEMISTRY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3943066441     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363902     Document Type: Article

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