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Volumn 92, Issue 6, 2008, Pages

Alignment layer effects on thin liquid crystal cells

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; LIQUID CRYSTALS; REFLECTION; THICKNESS MEASUREMENT;

EID: 39349118043     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2841642     Document Type: Article
Times cited : (143)

References (15)
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    • H. Wang, T. X. Wu, X. Zhu, and S. T. Wu, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1707210 95, 5502 (2004).
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    • T. J. Scheffer and J. Nehring, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.323928 48, 1783 (1977).
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    • Scheffer, T.J.1    Nehring, J.2
  • 15
    • 84889267838 scopus 로고    scopus 로고
    • Fundamentals of Liquid Crystal Devices (Wiley, New York).
    • D. K. Yang and S. T. Wu, Fundamentals of Liquid Crystal Devices (Wiley, New York, 2006).
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    • Yang, D.K.1    Wu, S.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.