Photothermal thickness measurement of multilayered structures: An experimental and numerical analysis

Journal of Applied Physics

Volumn 103, Issue 3, 2008, Pages

  Suter, P ^a   Graf, T ^a  

^a LUCERNE UNIVERSITY OF APPLIED SCIENCES AND ARTS   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; RADIOMETRY; SURFACE STRUCTURE;

GREEN'S FORMALISM; ONLINE THICKNESS DETECTION;

MULTILAYERS;

EID: 39349104160     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2837830     Document Type: Article

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