Radiation hardness studies of CdTe thin films for clinical high-energy photon beam detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 586, Issue 2, 2008, Pages 169-173

  Shvydka, Diana ^a   Parsai, E I ^a   Kang, J ^a  

^a University Toledo Health Science Campus ^*  (United States)

Author keywords

CdTe; Polycrystalline semiconductors; Portal imagers; Radiation hardness; X ray detectors

Indexed keywords

CADMIUM ALLOYS; DETECTORS; HARDNESS; POLYCRYSTALLINE MATERIALS; RADIATION EFFECTS; SEMICONDUCTOR MATERIALS; X RAY ANALYSIS;

POLYCRYSTALLINE SEMICONDUCTORS; PORTAL IMAGERS; RADIATION HARDNESS; X-RAY DETECTORS;

THIN FILMS;

EID: 39149129077     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.11.017     Document Type: Article

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