In-situ determination of cross-over point for overcoming plasma-related matrix effects in inductively coupled plasma-atomic emission spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 63, Issue 3, 2008, Pages 355-366

  Chan, George C Y ^a   Hieftje, Gary M ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

Cross over point; Inductively coupled plasma atomic emission spectrometry; Matrix effect; Plasma vertical profile

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; MATRIX ALGEBRA; PLASMA DEVICES; SENSITIVITY ANALYSIS;

MATRIX EFFECTS; PLASMA VERTICAL PROFILE;

ATOMIC EMISSION SPECTROSCOPY;

EID: 39149094267     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.12.009     Document Type: Article

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