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Volumn , Issue , 2002, Pages 727-730

Very low power high temperature stability bandgap reference voltage

Author keywords

[No Author keywords available]

Indexed keywords

BANDGAP REFERENCE; BANDGAP REFERENCE VOLTAGE; DESIGN METHODOLOGY; HIGH TEMPERATURE STABILITY; PERFECT MATCHES; PORTABLE APPLICATIONS; PROCESS CHARACTERIZATION; SENSITIVE DEVICES;

EID: 39049130191     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (7)
  • 2
    • 0015015144 scopus 로고
    • New developments in ic voltage regulators
    • Feb
    • R. Wildar, "New developments in IC voltage regulators," IEEE J. Solod-State Circuits, vol. 6, pp. 2-7, Feb. 1971.
    • (1971) IEEE J. Solod-State Circuits , vol.6 , pp. 2-7
    • Wildar, R.1
  • 3
    • 0016328924 scopus 로고
    • A simple three terminal ic bandgap reference
    • Dec
    • A. P. Brokaw, "A Simple Three Terminal IC Bandgap Reference," IEEE J. Solid-State Circuits, vol. SC-9, n6, Dec. 1974.
    • (1974) IEEE J. Solid-State Circuits , vol.SC-9 , Issue.6
    • Brokaw, A.P.1
  • 5
    • 0029636975 scopus 로고
    • Fast ldo's and switchers provide sub-5-v power
    • Sept. 5
    • F. Goodenough, "Fast LDO's and switchers provide sub-5-V power," Electron Design, pp. 65-74, Sept. 5, 1995.
    • (1995) Electron Design , pp. 65-74
    • Goodenough, F.1
  • 6
    • 84893729910 scopus 로고    scopus 로고
    • UTMOST Modeling Manual, SILVACO International, 4701 Patrick Henry Drive, Bldg. #2 Santa Clara, CA 94054
    • UTMOST Modeling Manual, SILVACO International, 4701 Patrick Henry Drive, Bldg. #2 Santa Clara, CA 94054.
  • 7
    • 0019009617 scopus 로고
    • Measurement of temperature dependence of the iC(VBE) characteristics of integrated bipolar transistors
    • April
    • Gerard C. M. Meijer and Kees Vingerling, "Measurement of temperature dependence of the IC(VBE) characteristics of integrated bipolar transistors," IEEE Journal of Solid-State Circuits, vol. SC-15, n2, pp. 237-240, April 1980.
    • (1980) IEEE Journal of Solid-State Circuits , vol.SC-15 , Issue.2 , pp. 237-240
    • Gerard, C.1    Meijer, M.2    Vingerling, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.