Frequency biases in pulsed atomic fountain frequency standards due to spurious components in the microwave spectrum

Proceedings of the IEEE International Frequency Control Symposium and Exposition

Volumn , Issue , 2006, Pages 273-276

  Heavner, T P ^a   Shirley, J H ^a   Levi, F ^b   Yu, D ^c   Jefferts, S R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^c Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; MICROWAVE POWER TRANSMISSION; MICROWAVE SPECTROSCOPY; PHASE MODULATION;

FREQUENCY BIASES; MICROWAVE SIGNAL; MICROWAVE SPECTRUM; SPURIOUS COMPONENTS;

FREQUENCY STANDARDS;

EID: 39049110225     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FREQ.2006.275394     Document Type: Conference Paper

References (3)

1. F. Levi, J.H. Shirley, T.P. Heavner, D. Yu, and S.R. Jefferts, "Power dependence of the frequency bias caused by spurious components in the microwave spectrum in atomic fountains," IEEE Trans. Ultrason. Ferr., in press.
2. C. Audoin, M. Jardino, L.S. Cutler, R.F. Lacey, "Frequency offset due to spectral impurities in cesium-beam standards," IEEE Trans. Instrum. Meas., vol. IM27, no. 4, pp. 325-329, 1978.
3. G.J. Dick, "Local oscillator induced instabilities in trapped ion frequency standards," Proc. 19th Annual PTTI Applications and Planning Meeting, Redondo Beach, CA, 1987, pp. 133-147.