Process mean, process tolerance, and use time determination for product life application under deteriorating process

International Journal of Advanced Manufacturing Technology

Volumn 36, Issue 1-2, 2008, Pages 97-113

  Jeang, Angus ^a   Chung, Chien Ping ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Cost; Deterioration; Process mean; Process tolerance; Reliability; Use time

Indexed keywords

COMPETITIVE INTELLIGENCE; DETERIORATION; MATHEMATICAL MODELS; RELIABILITY; SENSITIVITY ANALYSIS;

PROCESS MEAN; PROCESS TOLERANCE; PRODUCT LIFE APPLICATION;

PRODUCT DEVELOPMENT;

EID: 38949188721     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-006-0814-x     Document Type: Article

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