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Volumn , Issue , 2006, Pages 454-465

Prediction of timing constraint violation for real-time embedded systems with known transient hardware failure distribution model

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE DISTRIBUTION MODEL; TIME-CRITICAL SYSTEMS; TIMING CONSTRAINTS;

EID: 38949149651     PISSN: 10528725     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RTSS.2006.33     Document Type: Conference Paper
Times cited : (8)

References (19)
  • 2
    • 0020151687 scopus 로고
    • Derivation and caliberation of a transient error reliability model
    • X. Castillo, S. McConnel, and D. Siewiorek, "Derivation and caliberation of a transient error reliability model", IEEE Transactions on Computer, 31(7):658-671, 1982.
    • (1982) IEEE Transactions on Computer , vol.31 , Issue.7 , pp. 658-671
    • Castillo, X.1    McConnel, S.2    Siewiorek, D.3
  • 7
    • 21644481446 scopus 로고
    • A measurement-based model for workload dependence of CPU errors
    • R.K. Iyer and D.j.Rossetti, "A measurement-based model for workload dependence of CPU errors", IEEE Transactions on Computers, 33:518-528, 1984.
    • (1984) IEEE Transactions on Computers , vol.33 , pp. 518-528
    • Iyer, R.K.1    Rossetti, D.J.2
  • 8
    • 84976815079 scopus 로고
    • Measurement and modeling of computer reliability as affected by system activity
    • Aug
    • R.K. Iyer, D.j. Rossetti, and M.C. Hsueh, "Measurement and modeling of computer reliability as affected by system activity", ACM Transactions on Computer Systems, 4(3):214-237, Aug. 1986.
    • (1986) ACM Transactions on Computer Systems , vol.4 , Issue.3 , pp. 214-237
    • Iyer, R.K.1    Rossetti, D.J.2    Hsueh, M.C.3
  • 16
    • 38949203345 scopus 로고    scopus 로고
    • Expected Time for Obtaining Dependable Data in Real-Time Environment
    • submitted
    • Y. Yu and S. Ren, "Expected Time for Obtaining Dependable Data in Real-Time Environment", in Proc. 22nd ACM Symposium on Applied Computing, 2007, submitted.
    • (2007) Proc. 22nd ACM Symposium on Applied Computing
    • Yu, Y.1    Ren, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.