A unified framework for defect data analysis using the MBR technique

Proceedings - International Conference on Tools with Artificial Intelligence, ICTAI

Volumn , Issue , 2006, Pages 39-46

  Challagulla, Venkata U B ^a   Bastani, Farokh B ^a   Yen, I Ling ^a  

^a The University of Texas at Dallas   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MEMORY BASED REASONING; SOFTWARE DEFECT DATA;

COMPUTER SOFTWARE; PROBLEM SOLVING; PROJECT MANAGEMENT; RISK ANALYSIS;

DATA REDUCTION;

EID: 38949121974     PISSN: 10823409     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICTAI.2006.23     Document Type: Conference Paper

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