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Volumn 6, Issue 2, 2002, Pages 110-116
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Reply to critics
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 38849083159
PISSN: 01617249
EISSN: None
Source Type: Journal
DOI: 10.5840/techne2002626 Document Type: Review |
Times cited : (4)
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References (2)
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