A reconfiguration-based defect tolerance method for nanoscale devices

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2006, Pages 107-115

  Rad, Reza M P ^a   Tehranipoor, Mohammad ^a  

^a UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

Author keywords

Crossbar; Fault tolerance; Nanoscale devices; Reconfiguration; Redundancy; Test

Indexed keywords

CROSSBAR; DEFECT TOLERANCE; GREEDY SEARCH ALGORITHM; NANOSCALE DEVICES; RECONFIGURATION;

ALGORITHMS; BENCHMARKING; COMPUTER SIMULATION; DEFECTS; FAULT TOLERANCE; REDUNDANCY;

NANOSTRUCTURED MATERIALS;

EID: 38749150642     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2006.10     Document Type: Conference Paper

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