Understanding a degradation mechanism of direct methanol fuel cell using TOF-SIMS and XPS

Journal of Physical Chemistry C

Volumn 112, Issue 1, 2008, Pages 313-318

  Chung, Youngsu ^a   Pak, Chanho ^a   Park, Gyeong Su ^a   Jeon, Woo Sung ^a   Kim, Ji Rae ^a   Lee, Yoonhoi ^a   Chang, Hyuk ^a   Seung, Doyoung ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC FIELD EFFECTS; ELECTRODES; PLATINUM; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

MEMBRANE ELECTRODE ASSEMBLIES (MEA);

METHANOL FUELS;

EID: 38749144454     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp0759372     Document Type: Article

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