메뉴 건너뛰기




Volumn , Issue , 2006, Pages 466-474

Design of low power & reliable networks on chip through joint crosstalk avoidance and forward error correction coding

Author keywords

[No Author keywords available]

Indexed keywords

DATA TRANSFER; ERROR CORRECTION; MICROPROCESSOR CHIPS; MULTIPROCESSING SYSTEMS; PACKET NETWORKS; RELIABILITY; SWITCHING NETWORKS;

EID: 38749126805     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2006.22     Document Type: Conference Paper
Times cited : (49)

References (15)
  • 1
    • 0036149420 scopus 로고    scopus 로고
    • Networks on Chips: A New SoC Paradigm
    • Jan
    • L. Benini and G. De Micheli, "Networks on Chips: A New SoC Paradigm," Computer, vol. 35, no. 1, Jan. 2002, pp. 70-78
    • (2002) Computer , vol.35 , Issue.1 , pp. 70-78
    • Benini, L.1    De Micheli, G.2
  • 8
    • 24144461667 scopus 로고    scopus 로고
    • Performance Evaluation and Design Trade-offs for Network on Chip Interconnect Architectures
    • August
    • P. P. Pande, C. Grecu, M. Jones, A. Ivanov, R. Saleh, "Performance Evaluation and Design Trade-offs for Network on Chip Interconnect Architectures", IEEE Transactions on Computers, vol. 54, no. 8, pp. 1025-1040, August 2005.
    • (2005) IEEE Transactions on Computers , vol.54 , Issue.8 , pp. 1025-1040
    • Pande, P.P.1    Grecu, C.2    Jones, M.3    Ivanov, A.4    Saleh, R.5
  • 12
    • 24344477537 scopus 로고    scopus 로고
    • New ECC for Crosstalk Impact Minimization
    • D. Rossi, et al. "New ECC for Crosstalk Impact Minimization," IEEE Design and Test of Computers, 2005, pp. 340-348.
    • (2005) IEEE Design and Test of Computers , pp. 340-348
    • Rossi, D.1
  • 14
    • 23844498131 scopus 로고    scopus 로고
    • Timing Analysis of Network on Chip Architectures for MP-SoC Platforms
    • C. Grecu, P. P. Pande, A. Ivanov, R. Saleh, "Timing Analysis of Network on Chip Architectures for MP-SoC Platforms", Microelectronics Journal, Elsevier, Vol. 36, issue 9, pp. 833-845.
    • Microelectronics Journal, Elsevier , vol.36 , Issue.9 , pp. 833-845
    • Grecu, C.1    Pande, P.P.2    Ivanov, A.3    Saleh, R.4
  • 15
    • 0036539665 scopus 로고    scopus 로고
    • Technology and reliability constrained future copper interconnects - part II: Performance implications
    • K.C. Saraswat, et al., Technology and reliability constrained future copper interconnects - part II: performance implications, IEEE Transactions on Electron Devices, Vol. 49, issue 4, 2002 pp. 598-604.
    • (2002) IEEE Transactions on Electron Devices , vol.49 , Issue.4 , pp. 598-604
    • Saraswat, K.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.