Bruggeman effective medium approach for modelling optical properties of porous silicon: Comparison with experiment

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 6, 2007, Pages 1986-1990

  Khardani, M ^a   Bouaicha M ^a   Bessais B ^a  

^a RESEARCH AND TECHNOLOGY CENTER OF ENERGY   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED SURFACE; EFFECTIVE REFRACTIVE INDEX; EFFECTIVE-MEDIUM APPROACH; NOVEL INFORMATION; POROUS SILICON (PS); COMPARISON WITH EXPERIMENTS; EFFECTIVE MEDIUM; EFFECTIVE-MEDIUM APPROXIMATION; GOODMAN METHOD; OPTICAL PARAMETER; RELATIVE DIELECTRIC CONSTANT; SILICON DIOXIDE; TRANSMISSION SPECTRUMS;

CEMENTS; NONMETALS; OPTICAL MATERIALS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SEMICONDUCTING CADMIUM TELLURIDE; SILICON; SURFACE ANALYSIS; LIGHT TRANSMISSION; POROSITY; POROUS SILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICA;

POROUS SILICON; SILICON WAFERS;

EID: 38749126658     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200674420     Document Type: Conference Paper

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