Characterization of polycrystalline CuInSe2 thin films deposited by sputtering and evaporation as a function of composition

Journal of Physics and Chemistry of Solids

Volumn 69, Issue 2-3, 2008, Pages 435-440

  Yang, L C ^a   Cheng, C Y ^a   Fang, J S ^a  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE X RAY ANALYSIS; EVAPORATION; MICROSTRUCTURE; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACE MORPHOLOGY; THIN FILMS;

LATTICE IMAGE; LOW DEFECT DENSITIES;

POLYCRYSTALLINE MATERIALS;

EID: 38749085279     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2007.07.027     Document Type: Article

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