A sensitivity model for multi-pinhole SPECT

IEEE Nuclear Science Symposium Conference Record

Volumn 3, Issue , 2006, Pages 1842-1847

  DiFilippo, Frank P ^a,b  

^a IEEE

^b LERNER RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; IMAGE QUALITY; IMAGE RECONSTRUCTION; MATHEMATICAL MODELS; MEDICAL IMAGING; SENSITIVITY ANALYSIS;

APERTURE DIAMETER; SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY (SPECT); TOPINHOLE DISTANCE;

PHOTONS;

EID: 38649129934     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2006.354252     Document Type: Conference Paper

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