Studies on a possible growth mechanism of silver nanoparticles loaded on TiO2 thin films by photoinduced deposition method

Journal of Non-Crystalline Solids

Volumn 354, Issue 12-13, 2008, Pages 1267-1271

  He, Xin ^a   Zhao, Xiujian ^a   Liu, Baoshun ^a  

^a WUHAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Atomic force microscopes (AFM); Microscopy of surfaces, interfaces, and thin films; Nanocrystals; Nucleation and growth; Optical properties of specific thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTION BANDS; CRYSTAL GROWTH; DEPOSITION; NANOCRYSTALS; NUCLEATION; OPTICAL PROPERTIES; PHOTOEXCITATION; THIN FILMS; TITANIUM DIOXIDE;

CONDUCTION BAND POSITION; METALLIC SILVER; PHOTOINDUCED DEPOSITION METHOD;

NANOPARTICLES;

EID: 38649118900     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.11.037     Document Type: Article

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