Multi-channel front-end readout IC for position sensitive solid-state detectors

IEEE Nuclear Science Symposium Conference Record

Volumn 1, Issue , 2006, Pages 384-388

  Tümer, Tümay O ^b   Cajipe, Victoria B ^b   Clajus, Martin ^b   Hayakawa, Satoshiz ^b   Volkovskii, Alexander ^a,b  

^a IEEE

^b Durham Scientific Crystals Ltd   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; GAMMA RAYS; INTEGRATED CIRCUITS; NUCLEAR PHYSICS; OPTIMIZATION; SEMICONDUCTING GALLIUM ARSENIDE;

NOISE CHANNELS; SOLID-STATE DETECTORS;

SEMICONDUCTOR DETECTORS;

EID: 38649092452     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2006.356181     Document Type: Conference Paper

References (4)

1. Kravis, S.D., Maeding, D.G., Tümer, T.O., Visser, G., Yin, S., "Test Results of the Readout Electronics for Nuclear Applications (RENA) Chip Developed for Position-Sensitive Solid State Detectors," SPIE Symposium Proceedings 3445, 374 (1998). Available at http://www.novarad.com/ pages/documents/RENA_test_results_SPIE_1998.PDF.
2. a) Tümer, T.O., V.B. Cajipe, M. Clajus, H. Flores, C.A. Shirley, G. Visser, and D. Ward, Preliminary Test Results of RENA-2 ASIC Developed for Position-Sensitive X-ray and Gamma-Ray Detectors, contribution to the 2002 IEEE Nuclear Science Symposium, Norfolk, VA, Nov. 2002;
3. b) Tümer, T.O., V. Cajipe, A.C. Shirley, M. Clajus, S. Hayakawa, G. Visser, J. Matteson and D. Ward, Preliminary test results of a low-noise integrated circuit (IC) developed for position sensitive solid state detectors, contribution to: the International Symposium on Optical Science and Technology (SPIE's 48th Annual Meeting and Exhibition), San Diego, CA, August 2003; and
4. c) Tümay O. Tümer, Victoria B. Cajipe, Martin Clajus, Fred Duttweiler, Satoshi Hayakawa, James L. Matteson, Arnie Shirley and Oded Yossifor, Test Results of a CdZnTe.Pixel Detector Read Ourt by RENA-2 IC, IEEE Nuclear Science Symposium Conference Record, Rome, Italy, Oct. 2004.