IDeF-X V1.1: Performances of a new CMOS 16 channels analogue readout ASIC for Cd(Zn)Te detectors

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2006, Pages 841-844

  Lugiez, F ^a   Gevin, O ^a   Baron, P ^a   Delagnes, E ^a   Limousin, O ^b  

^a CEA SACLAY   (France)

^b UNIVERSITÉ PARIS DIDEROT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; DATA ACQUISITION; GAMMA RAYS; OPTIMIZATION; X RAY SPECTROSCOPY;

CHANNELS ANALOGUE; IMAGING DETECTORS; PEAK DETECTORS;

CMOS INTEGRATED CIRCUITS;

EID: 38649087387     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2006.355981     Document Type: Conference Paper

References (5)

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5. O. Gevin, F. Lugiez, O. Limousin, B. P. F. Dirks, C. Blondel, X. Coppolani, P. Baron and E. Delagnes, "IDeF-X V1.0: Performances of a new CMOS multi channel analogue readout ASIC for Cd(Zn)Te detectors", in Proc. IEEE NSS-MIC conf. Rec., pp. 433-437, 2005.