X-ray micro-tomography coupled to the extended finite element method to investigate microstructurally short fatigue cracks

Materials Science Forum

Volumn 567-568, Issue , 2008, Pages 301-304

  Ferrié, Emilie ^a   Buffière, Jean Yves ^b   Ludwig, Wolfgang ^b   Gravouil, Anthony ^c  

^a SRMA   (France)

^b UNIVERSITÉ DE LYON   (France)

^c UNIVERSITÉ DE LYON   (France)

Author keywords

Extended finite element method; Fatigue; Mixed mode stress intensity factor; X ray micro tomography

Indexed keywords

EID: 38549178452     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (9)

1. Ludwig W, Buffière JY, Savelli S, Cloetens P. Acta Mater, 2003;51:585-98.
2. Ferrie E, Ludwig W, Buffière JY, Int. Journal of Fatigue, Vol. 27, 2005, pages 1215-1220.
3. Buffière.JY and Savelli,S and Jouneau,PH, Materials Science and Engineering : A, 2001,316(1),
4. Belytschko T, Black T. Int J Numer Meth Eng 1999;45:601-20.
5. Osher S, Sethian JA. J Comput Phys 1988;79:12-49
6. E.Ferrié, J-Y. Buffière, W.Ludwig, A.Gravouil, Acta Materialia. Vol. 54, Issue 4, February 2006, Pages 1111-1122
7. Gosz M, Moran B. Eng Fract Mech 2002;69:299-319.
8. Newman JC, Raju IS. ASTM STP 791 198:238.
9. Gravouil A. Moes N, Belytschko T. Int J Numer Meth Eng, 2002;53:2569-86.